DocumentCode :
2634482
Title :
Product reliability at low failure rates: Wrong expectations and real limitations
Author :
Kanert, Werner
Author_Institution :
IFAG ATV QM QE, Infineon Technol., Neubiberg, Germany
fYear :
2012
fDate :
15-19 April 2012
Abstract :
The automotive industry serves as a prominent example for high reliability requirements under harsh application conditions. Reliability assessment is torn between expectations from customers and what it can realistically achieve, reliability testing being limited by both technical and economical reasons. Furthermore, reliability methodology on package and product level severely lags behind what we have become accustomed to on the wafer technology side. The paper looks at some of the issues and implications when assessment of low failure rates is required.
Keywords :
automotive components; automotive electronics; failure analysis; semiconductor device reliability; automotive industry; low failure rate assessment; product reliability; reliability assessment; wafer technology; Acceleration; Failure analysis; Life estimation; Qualifications; Semiconductor device reliability; Stress; Reliability; automotive; failure rate; qualification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1541-7026
Print_ISBN :
978-1-4577-1678-2
Electronic_ISBN :
1541-7026
Type :
conf
DOI :
10.1109/IRPS.2012.6241851
Filename :
6241851
Link To Document :
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