DocumentCode :
2634626
Title :
An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting
Author :
Dworak, Jennifer
Author_Institution :
Brown Univ., Providence, RI
fYear :
2007
fDate :
6-10 May 2007
Firstpage :
205
Lastpage :
210
Abstract :
Fortuitous detection increases with multiple site observations and good excitation balance. However, this increases test data volume. The authors investigate weighted random patterns generated with partial fault targeting and show that they may be equally or more effective at fortuitous detection than an ATPG set with the same minimal site observations.
Keywords :
automatic test pattern generation; fault diagnosis; ATPG; automatic test pattern generation; defect detection; partial fault targeting; Automatic test pattern generation; Bridge circuits; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Hardware; Logic; Pattern analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location :
Berkeley, CA
ISSN :
1093-0167
Print_ISBN :
0-7695-2812-0
Type :
conf
DOI :
10.1109/VTS.2007.14
Filename :
4209914
Link To Document :
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