Title :
Accelerating Diagnosis via Dominance Relations between Sets of Faults
Author :
Adapa, Rajsekhar ; Tragoudas, Spyros ; Michael, Maria K.
Author_Institution :
Dept. of ECE, Southern Illinois Univ., Carbondale, IL
Abstract :
A new way of fault collapsing for effect-cause diagnosis is presented. In contrast to existing dominance-based methods which operate on a pair of faults, the proposed method operates on pairs of sets of faults. The impact of the proposed method is evaluated with respect to effect-cause diagnosis. Experimental results show that the proposed collapsing methods can reduce the diagnostic simulation time on an average of 31% when compared to the existing techniques
Keywords :
fault simulation; integrated circuit testing; effect-cause diagnosis; fault collapsing; fault diagnosis; Acceleration; Algorithm design and analysis; Cause effect analysis; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Failure analysis; Fault detection; Fault diagnosis;
Conference_Titel :
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7695-2812-0
DOI :
10.1109/VTS.2007.10