DocumentCode :
2634675
Title :
Accelerating Diagnosis via Dominance Relations between Sets of Faults
Author :
Adapa, Rajsekhar ; Tragoudas, Spyros ; Michael, Maria K.
Author_Institution :
Dept. of ECE, Southern Illinois Univ., Carbondale, IL
fYear :
2007
fDate :
6-10 May 2007
Firstpage :
219
Lastpage :
224
Abstract :
A new way of fault collapsing for effect-cause diagnosis is presented. In contrast to existing dominance-based methods which operate on a pair of faults, the proposed method operates on pairs of sets of faults. The impact of the proposed method is evaluated with respect to effect-cause diagnosis. Experimental results show that the proposed collapsing methods can reduce the diagnostic simulation time on an average of 31% when compared to the existing techniques
Keywords :
fault simulation; integrated circuit testing; effect-cause diagnosis; fault collapsing; fault diagnosis; Acceleration; Algorithm design and analysis; Cause effect analysis; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Failure analysis; Fault detection; Fault diagnosis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location :
Berkeley, CA
ISSN :
1093-0167
Print_ISBN :
0-7695-2812-0
Type :
conf
DOI :
10.1109/VTS.2007.10
Filename :
4209916
Link To Document :
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