DocumentCode
2634828
Title
Parameter Estimation for a Model with Both Imperfect Test and Repair
Author
Wilson, Simon ; Flood, Ben ; Goyal, Suresh ; Mosher, Jim ; Bergin, Susan ; O´Brien, Joseph ; Kennedy, Robert
Author_Institution
Centre for Telecommun. Value-Chain Res., Trinity Coll., Dublin
fYear
2007
fDate
6-10 May 2007
Firstpage
271
Lastpage
276
Abstract
We describe estimation of the parameters of a manufacturing test and repair model using data available from that test. The model allows imperfect testing and imperfect repair. The principal problem that we address is of parameter identification, given insufficient data, that we address by making conservative assumptions on the property being measured and the associated parameter values. Several cases of commonly occurring test types, in the manufacture of electronic products, are considered.
Keywords
integrated circuit modelling; integrated circuit testing; parameter estimation; electronic product manufacture; imperfect repair; imperfect test; manufacturing test model; parameter estimation; parameter identification; repair model; Assembly; Computer aided manufacturing; Cost function; Educational institutions; Electronic equipment testing; Mathematical model; Parameter estimation; Proposals; Pulp manufacturing; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location
Berkeley, CA
ISSN
1093-0167
Print_ISBN
0-7695-2812-0
Type
conf
DOI
10.1109/VTS.2007.48
Filename
4209924
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