• DocumentCode
    2634828
  • Title

    Parameter Estimation for a Model with Both Imperfect Test and Repair

  • Author

    Wilson, Simon ; Flood, Ben ; Goyal, Suresh ; Mosher, Jim ; Bergin, Susan ; O´Brien, Joseph ; Kennedy, Robert

  • Author_Institution
    Centre for Telecommun. Value-Chain Res., Trinity Coll., Dublin
  • fYear
    2007
  • fDate
    6-10 May 2007
  • Firstpage
    271
  • Lastpage
    276
  • Abstract
    We describe estimation of the parameters of a manufacturing test and repair model using data available from that test. The model allows imperfect testing and imperfect repair. The principal problem that we address is of parameter identification, given insufficient data, that we address by making conservative assumptions on the property being measured and the associated parameter values. Several cases of commonly occurring test types, in the manufacture of electronic products, are considered.
  • Keywords
    integrated circuit modelling; integrated circuit testing; parameter estimation; electronic product manufacture; imperfect repair; imperfect test; manufacturing test model; parameter estimation; parameter identification; repair model; Assembly; Computer aided manufacturing; Cost function; Educational institutions; Electronic equipment testing; Mathematical model; Parameter estimation; Proposals; Pulp manufacturing; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2007. 25th IEEE
  • Conference_Location
    Berkeley, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2812-0
  • Type

    conf

  • DOI
    10.1109/VTS.2007.48
  • Filename
    4209924