DocumentCode :
2634828
Title :
Parameter Estimation for a Model with Both Imperfect Test and Repair
Author :
Wilson, Simon ; Flood, Ben ; Goyal, Suresh ; Mosher, Jim ; Bergin, Susan ; O´Brien, Joseph ; Kennedy, Robert
Author_Institution :
Centre for Telecommun. Value-Chain Res., Trinity Coll., Dublin
fYear :
2007
fDate :
6-10 May 2007
Firstpage :
271
Lastpage :
276
Abstract :
We describe estimation of the parameters of a manufacturing test and repair model using data available from that test. The model allows imperfect testing and imperfect repair. The principal problem that we address is of parameter identification, given insufficient data, that we address by making conservative assumptions on the property being measured and the associated parameter values. Several cases of commonly occurring test types, in the manufacture of electronic products, are considered.
Keywords :
integrated circuit modelling; integrated circuit testing; parameter estimation; electronic product manufacture; imperfect repair; imperfect test; manufacturing test model; parameter estimation; parameter identification; repair model; Assembly; Computer aided manufacturing; Cost function; Educational institutions; Electronic equipment testing; Mathematical model; Parameter estimation; Proposals; Pulp manufacturing; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location :
Berkeley, CA
ISSN :
1093-0167
Print_ISBN :
0-7695-2812-0
Type :
conf
DOI :
10.1109/VTS.2007.48
Filename :
4209924
Link To Document :
بازگشت