DocumentCode :
2634838
Title :
Fabrication of X-ray Mask using Poly-Si Microstructure for Diffraction Grating
Author :
Shimada, Kazuma ; Tsujii, Hiroshi ; Noda, Daiji ; Hattori, Tadashi
Author_Institution :
Univ. of Hyogo, Ako
fYear :
2007
fDate :
11-14 Nov. 2007
Firstpage :
448
Lastpage :
453
Abstract :
There is an X-ray Talbot interferometer in one of the imaging technology by X-ray phase information. A diffraction grating is necessary for a Talbot interferometer, but the manufacture is difficult. In this study, we decided to make a diffraction grating to use it for a Talbot interferometer in X-ray lithography. For the development of a fine and high-precision X-ray mask, a rectangular structure of a high aspect ratio was formed through conventional UV lithography incorporating an ICP-based Si dry etching process that enables fine patterning. We succeeded in making 2.2 mum in width, a Poly-Si structure body of 4.7 mum high. We succeeded in forming 2.6 mum in width, a gold absorber of 4.2 mum high by Au electrolysis plating. We succeeded in making 2.2 mum in width, a SU-8 structure body of 10 mum high by X-ray lithography. Conventionally, we were able to complete a fine X-ray mask.
Keywords :
X-ray masks; elemental semiconductors; silicon; ultraviolet lithography; Si; UV lithography; X-ray Talbot interferometer; X-ray lithography; X-ray mask; X-ray phase information; diffraction grating; electrolysis plating; poly-si microstructure; Diffraction gratings; Fabrication; Gold; Interferometric lithography; Manufacturing; Microstructure; Optical imaging; X-ray diffraction; X-ray imaging; X-ray lithography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro-NanoMechatronics and Human Science, 2007. MHS '07. International Symposium on
Conference_Location :
Nagoya
Print_ISBN :
978-1-4244-1858-9
Electronic_ISBN :
978-1-4244-1858-9
Type :
conf
DOI :
10.1109/MHS.2007.4420897
Filename :
4420897
Link To Document :
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