Title :
Efficient RTL Coverage Metric for Functional Test Selection
Author :
Kang, Jian ; Seth, Sharad C. ; Gangaram, Vijay
Author_Institution :
Dept. of Comput. Sci. & Eng., Nebraska Univ., Lincoln, NE
Abstract :
For performance-critical microprocessors, efficient test-selection methods are needed for reusing a subset of functional validation tests to detect manufacturing defects. Our new input/output transition fault-coverage metric (TRIO) at the register-transfer level is shown to perform much better than current metric in test selection at only an incrementally higher computational cost. TRIO may also be used for testability analysis early in the design cycle
Keywords :
design for testability; integrated circuit testing; microprocessor chips; RTL coverage metric; functional test selection; functional validation tests; manufacturing defect detection; performance-critical microprocessors; register-transfer level; testability analysis; transition fault-coverage metric; Automatic testing; Circuit faults; Circuit testing; Computational efficiency; Computational modeling; Logic; Manufacturing; Microprocessors; Performance evaluation; Semiconductor device manufacture;
Conference_Titel :
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7695-2812-0
DOI :
10.1109/VTS.2007.30
