• DocumentCode
    2635190
  • Title

    Alternate Diagnostic Testing and Compensation of RF Transmitter Performance Using Response Detection

  • Author

    Senguttuvan, Rajarajan ; Chatterjee, Abhijit

  • Author_Institution
    Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA
  • fYear
    2007
  • fDate
    6-10 May 2007
  • Firstpage
    395
  • Lastpage
    400
  • Abstract
    Digital predistortion is used as a compensation technique in communication systems to minimize the effect of power amplifier non-linearity while increasing its operational efficiency. Prior linearization schemes use the receiver chain to feed data to the baseband processor that adaptively adjusts the predistortion coefficients. The procedure is iterative, requires many test applications, is sensitive to receiver quality, and is not suitable for RF communication front ends in which the mixer, LNA and PA are dynamically reconfigured to adapt to changing operating conditions. In the proposed scheme, a single multi-sine diagnostic test is applied from the baseband, and the response of the transmitter is captured via a response envelope detector. A novel unified methodology for co-tuning predistortion coefficients along with the PA bias voltage based on response diagnosis is proposed, thereby, enabling the transmitter to operate at high efficiency and linearity.
  • Keywords
    integrated circuit testing; low noise amplifiers; mixers (circuits); power amplifiers; radio transmitters; radiocommunication; LNA; PA; RF communication; RF transmitter; alternate diagnostic testing; baseband processor; communication systems; compensation technique; digital predistortion; linearization schemes; mixer; multisine diagnostic test; power amplifier nonlinearity; predistortion coefficients; response detection; response diagnosis; response envelope detector; Baseband; Envelope detectors; Feeds; Operational amplifiers; Power amplifiers; Predistortion; Radio frequency; Radiofrequency amplifiers; Testing; Transmitters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2007. 25th IEEE
  • Conference_Location
    Berkeley, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2812-0
  • Type

    conf

  • DOI
    10.1109/VTS.2007.12
  • Filename
    4209944