DocumentCode :
2635190
Title :
Alternate Diagnostic Testing and Compensation of RF Transmitter Performance Using Response Detection
Author :
Senguttuvan, Rajarajan ; Chatterjee, Abhijit
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA
fYear :
2007
fDate :
6-10 May 2007
Firstpage :
395
Lastpage :
400
Abstract :
Digital predistortion is used as a compensation technique in communication systems to minimize the effect of power amplifier non-linearity while increasing its operational efficiency. Prior linearization schemes use the receiver chain to feed data to the baseband processor that adaptively adjusts the predistortion coefficients. The procedure is iterative, requires many test applications, is sensitive to receiver quality, and is not suitable for RF communication front ends in which the mixer, LNA and PA are dynamically reconfigured to adapt to changing operating conditions. In the proposed scheme, a single multi-sine diagnostic test is applied from the baseband, and the response of the transmitter is captured via a response envelope detector. A novel unified methodology for co-tuning predistortion coefficients along with the PA bias voltage based on response diagnosis is proposed, thereby, enabling the transmitter to operate at high efficiency and linearity.
Keywords :
integrated circuit testing; low noise amplifiers; mixers (circuits); power amplifiers; radio transmitters; radiocommunication; LNA; PA; RF communication; RF transmitter; alternate diagnostic testing; baseband processor; communication systems; compensation technique; digital predistortion; linearization schemes; mixer; multisine diagnostic test; power amplifier nonlinearity; predistortion coefficients; response detection; response diagnosis; response envelope detector; Baseband; Envelope detectors; Feeds; Operational amplifiers; Power amplifiers; Predistortion; Radio frequency; Radiofrequency amplifiers; Testing; Transmitters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location :
Berkeley, CA
ISSN :
1093-0167
Print_ISBN :
0-7695-2812-0
Type :
conf
DOI :
10.1109/VTS.2007.12
Filename :
4209944
Link To Document :
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