Title :
Row-based area-array I/O design planning in concurrent chip-package design flow
Author :
Lee, Ren-jie ; Chen, Hung-Ming
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
IC-centric design flow has been a common paradigm when designing and optimizing a system. Package and board/system designs are usually followed by almost-ready chip designs, which causes long turn-around time communicating with package and system houses. In this paper, the realizations of area-array I/O design methodologies are studied. Different from IC-centric flow, we propose a chip-package concurrent design flow to speed up the design time. Along with the flow, we design the I/O-bump (and P/G-bump) tile which combines I/O (and P/G) and bump into a hard macro with the considerations of I/O power connection and electrostatic discharge (ESD) protection. We then employ an I/O-row based scheme to place I/O-bump tiles with existed metal layers. By such a scheme, it reduces efforts in I/O placement legalization and the redistribution layer (RDL) routing. With the emphasis on package design awareness, the proposed methods map package balls onto chip I/Os, thus providing an opportunity to design chip and package in parallel. Due to this early study of I/O and bump planning, faster convergence can be expected with concurrent design flow. The results are encouraging and the merits of this flow are reassuring.
Keywords :
electrostatic discharge; integrated circuit design; integrated circuit packaging; I/O-bump tile design; IC-centric design flow; board-system design; chip-package concurrent design flow; electrostatic discharge protection; map package ball method; power connection; redistribution layer routing; row-based area-array I/O design planning; Algorithm design and analysis; Arrays; Electrostatic discharge; Planning; Routing; Sorting; Tiles;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-7515-5
DOI :
10.1109/ASPDAC.2011.5722307