Title :
Heterogeneous Multiprocessor Synthesis under Performance and Reliability Constraints
Author :
Sugihara, Makoto
Author_Institution :
Dept. of Inf. & Comput. Sci., Toyohashi Univ. of Technol., Toyohashi, Japan
Abstract :
Utilizing a heterogeneous multiprocessor system has become a popular design paradigm to build an embedded system at a cheap cost. A reliability issue, which is vulnerability to single event upsets (SEUs), has not been taken into account in a conventional IC (integrated circuit) design flow, while chip area, performance, and power consumption have been done. This paper presents a system design paradigm in which a heterogeneous multiprocessor system is synthesized and its chip area is minimized under real-time and reliability constraints. First we define an SEU vulnerability factor for computer systems so that we evaluate reliability of a task over various processor configurations. Next we build a mixed integer linear programming (MILP) model for minimizing chip area of a heterogeneous multiprocessor system under real-time and SEU vulnerability constraints. Finally, we show several experimental results on our synthesis approach. Experimental results show that our design paradigm has achieved automatic generation of cost-competitive and reliable heterogeneous multiprocessor systems.
Keywords :
embedded systems; integer programming; integrated circuit reliability; linear programming; microprocessor chips; multiprocessing systems; radiation hardening (electronics); real-time systems; MILP model; SEU vulnerability factor; automatic generation; chip area minimization; embedded system; heterogeneous multiprocessor synthesis; mixed integer linear programming; real-time system; reliability constraints; single event upsets; Costs; Embedded system; Energy consumption; Integrated circuit reliability; Integrated circuit synthesis; Multiprocessing systems; Power system reliability; Real time systems; Single event transient; Single event upset; Heterogeneous Multiprocessor Synthesis; Real-Time System; Reliability; Single Event Upset; Soft Error;
Conference_Titel :
Digital System Design, Architectures, Methods and Tools, 2009. DSD '09. 12th Euromicro Conference on
Conference_Location :
Patras
Print_ISBN :
978-0-7695-3782-5
DOI :
10.1109/DSD.2009.217