• DocumentCode
    2635291
  • Title

    Static off state and conduction state charge imbalance in the superjunction power MOSFET

  • Author

    Kondekar, P.N.

  • Author_Institution
    Dept. of Electron. Eng., Kon-Kuk Univ., Seoul, South Korea
  • Volume
    4
  • fYear
    2003
  • fDate
    15-17 Oct. 2003
  • Firstpage
    1455
  • Abstract
    The superjunction (SJ) layer for 600 V is analytically designed for perfect charge balance and compared with SJ MOSFET, where the channel region creates charge imbalance due to unsymmetrical drift layer. We estimated this imbalance created due to the channel region with the help simulation. In order to simulate the SJ MOSFET with physical limitations of the fabrication technology, we have deliberately introduced the imbalance in SJ drift layer by varying the doping density of p pillar and then of n drift layer up to 10% respectively. The effect of this imbalance on the off state and on the on state breakdown voltage of the device investigated in detail with the help of simulation.
  • Keywords
    doping profiles; power MOSFET; semiconductor device models; semiconductor doping; semiconductor junctions; 600 V; channel region; conduction state charge imbalance; static off state; superjunction layer; superjunction power MOSFET; unsymmetrical drift layer; Analytical models; Doping profiles; Electric breakdown; Fabrication; Geometry; MOSFET circuits; Neck; Power MOSFET; Power engineering and energy; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2003. Conference on Convergent Technologies for the Asia-Pacific Region
  • Print_ISBN
    0-7803-8162-9
  • Type

    conf

  • DOI
    10.1109/TENCON.2003.1273159
  • Filename
    1273159