DocumentCode :
2635447
Title :
A Standardized Knobs and Monitors RTL2RTL Insertion Methodology for Fine Grain SoC Tuning
Author :
AbdelHamid, A. ; Anchlia, A. ; Mamagkakis, S. ; Miranda, M.C. ; Dierickx, B. ; Kuijk, M.
Author_Institution :
Smart Syst. & Energy Technol. Unit, MEC, Leuven, Belgium
fYear :
2009
fDate :
27-29 Aug. 2009
Firstpage :
401
Lastpage :
408
Abstract :
Nowadays, sub-45 nm designs are facing the challenges of parametric yield loss and reliability issues. Existing design practices increase the system´s area/power penalty in order to cope with the growing number of design corners and their widening distributions. Our proposed solution is the Standardized Knobs and Monitors (SKM) framework, which enables monitoring and adjusting the circuits at run-time by utilizing power-delay trade-offs. More specifically, we focus on the systematic insertion of digital monitors at the RTL level of design abstraction and demonstrate our approach by using modified crystal ball delay monitor in a real-life wireless application.
Keywords :
circuit tuning; integrated circuit design; integrated circuit reliability; integrated circuit testing; integrated circuit yield; logic design; nanoelectronics; system-on-chip; RTL2RTL insertion methodology; SoC design; SoC reliability; Standardized Knobs and Monitors framework; design abstraction; digital monitors; fine grain SoC tuning; modified crystal ball delay monitor; parametric yield loss; power-delay trade-off; real-life wireless application; Circuit testing; Clouds; Control systems; Degradation; Delay; Design methodology; Energy consumption; Manufacturing; Power system reliability; Runtime; RTL2RTL; Reliability; SKM; VAM; crystal ball; delay monitor; knob; monitor; razor; variability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design, Architectures, Methods and Tools, 2009. DSD '09. 12th Euromicro Conference on
Conference_Location :
Patras
Print_ISBN :
978-0-7695-3782-5
Type :
conf
DOI :
10.1109/DSD.2009.239
Filename :
5350071
Link To Document :
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