DocumentCode :
2635506
Title :
Improving defect localization techniques with laser beam with specific analysis and set-up modules
Author :
Llido, R. ; Gomez, J. ; Goubier, V. ; Haller, G. ; Pouget, V. ; Lewis, D.
Author_Institution :
STMicroelectron., Rousset, France
fYear :
2012
fDate :
15-19 April 2012
Abstract :
This paper describes a way to improve commonly used static laser stimulation techniques. Several analysis and set-up modules are presented to enrich them. Quickly assembled, combinable and easily adaptable, they allow for example to face atypical failure analysis cases. Effectiveness of this methodology is verified by two cases study. The proposed methodology further extends the capabilities of Laser Stimulation techniques in debug design and characterization domains.
Keywords :
failure analysis; laser beam applications; laser beams; atypical failure analysis; characterization domains; debug design; defect localization; laser beam; set-up modules; specific analysis; static laser stimulation; Current measurement; Failure analysis; Heating; Laser applications; Measurement by laser beam; Power supplies; Debug Design; Failure Analysis; Static Laser Stimulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1541-7026
Print_ISBN :
978-1-4577-1678-2
Electronic_ISBN :
1541-7026
Type :
conf
DOI :
10.1109/IRPS.2012.6241903
Filename :
6241903
Link To Document :
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