DocumentCode
2635506
Title
Improving defect localization techniques with laser beam with specific analysis and set-up modules
Author
Llido, R. ; Gomez, J. ; Goubier, V. ; Haller, G. ; Pouget, V. ; Lewis, D.
Author_Institution
STMicroelectron., Rousset, France
fYear
2012
fDate
15-19 April 2012
Abstract
This paper describes a way to improve commonly used static laser stimulation techniques. Several analysis and set-up modules are presented to enrich them. Quickly assembled, combinable and easily adaptable, they allow for example to face atypical failure analysis cases. Effectiveness of this methodology is verified by two cases study. The proposed methodology further extends the capabilities of Laser Stimulation techniques in debug design and characterization domains.
Keywords
failure analysis; laser beam applications; laser beams; atypical failure analysis; characterization domains; debug design; defect localization; laser beam; set-up modules; specific analysis; static laser stimulation; Current measurement; Failure analysis; Heating; Laser applications; Measurement by laser beam; Power supplies; Debug Design; Failure Analysis; Static Laser Stimulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4577-1678-2
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2012.6241903
Filename
6241903
Link To Document