• DocumentCode
    2635506
  • Title

    Improving defect localization techniques with laser beam with specific analysis and set-up modules

  • Author

    Llido, R. ; Gomez, J. ; Goubier, V. ; Haller, G. ; Pouget, V. ; Lewis, D.

  • Author_Institution
    STMicroelectron., Rousset, France
  • fYear
    2012
  • fDate
    15-19 April 2012
  • Abstract
    This paper describes a way to improve commonly used static laser stimulation techniques. Several analysis and set-up modules are presented to enrich them. Quickly assembled, combinable and easily adaptable, they allow for example to face atypical failure analysis cases. Effectiveness of this methodology is verified by two cases study. The proposed methodology further extends the capabilities of Laser Stimulation techniques in debug design and characterization domains.
  • Keywords
    failure analysis; laser beam applications; laser beams; atypical failure analysis; characterization domains; debug design; defect localization; laser beam; set-up modules; specific analysis; static laser stimulation; Current measurement; Failure analysis; Heating; Laser applications; Measurement by laser beam; Power supplies; Debug Design; Failure Analysis; Static Laser Stimulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2012 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4577-1678-2
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2012.6241903
  • Filename
    6241903