DocumentCode :
26357
Title :
Write Pattern Format Algorithm for Reliable NAND-Based SSDs
Author :
Quan Xu ; Chen, Thomas ; Yupeng Hu ; Pu Gong
Author_Institution :
Sch. of Eng. & Math. Sci., City Univ. London, London, UK
Volume :
61
Issue :
7
fYear :
2014
fDate :
Jul-14
Firstpage :
516
Lastpage :
520
Abstract :
This brief presents and evaluates a pre-coding algorithm to reduce power consumption and improve data retention in NAND-based solid-state drives. Compared to the state-of-the-art asymmetric coding and stripe pattern elimination algorithm, the proposed write pattern format algorithm (WPFA) achieves better data retention while consuming less power. The hardware for WPFA is simpler and requires less circuitry. The performance of WPFA is evaluated by both computer simulations and field-programmable gate array implementation.
Keywords :
NAND circuits; circuit reliability; driver circuits; field programmable gate arrays; flash memories; precoding; NAND-based solid-state drive; WPFA; asymmetric coding; data retention; field-programmable gate array; power consumption; precoding algorithm; reliable NAND flash-based SSD; stripe pattern elimination algorithm; write pattern format algorithm; Ash; Capacitance; Complexity theory; Encoding; Field programmable gate arrays; Logic gates; Registers; NAND flash memory; power consumption; reliability; solid-state drive (SSD);
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2014.2327332
Filename :
6823152
Link To Document :
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