• DocumentCode
    2635740
  • Title

    Research on the EFT radiation characteristic of classical structures used in Measuring-control System

  • Author

    Liu, Chao ; Wang, Lixin ; Zhao, Dan ; Luo, Weilin

  • Author_Institution
    Sch. of Electr. Eng. & Autom., Harbin Inst. of Technol., Harbin, China
  • fYear
    2011
  • fDate
    21-23 June 2011
  • Firstpage
    948
  • Lastpage
    952
  • Abstract
    This paper analyzed the Electrical Fast Transient (EFT) radiation interference characteristic and effect factors of three classical structures including: the electromagnetic relay, the inductance coil and the thin wire which are commonly used in the Measuring-control System. The EFT interference radiation model has been built by the NUFDTD method. This method divides the simulation space into a sort of grids which are non-uniform. Thus it can acquire a more detailed simulation model while using less computational resource. Use this method, the changing regularity of EFT radiation field, when the different stimulate source being put on the according structure, has been studied. At the same time, the corresponding relationship of the distributing characteristic of the EFT radiation field and the device structure has been discussed. Finally, based on the analysis and discuss conclusion, according to each classical structure, some anti-interference methods have been brought forward.
  • Keywords
    coils; electromagnetic interference; finite difference time-domain analysis; inductance; EFT interference radiation model; EFT radiation field; EFT radiation interference characteristic; NUFDTD method; classical structure; electrical fast transient; electromagnetic relay; inductance coil; measuring-control system; simulation model; thin wire; Coils; Electromagnetics; Inductance; Interference; Magnetic noise; Relays; Wires; EFT; NUFDTD method; radiation characteristic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2011 6th IEEE Conference on
  • Conference_Location
    Beijing
  • ISSN
    pending
  • Print_ISBN
    978-1-4244-8754-7
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/ICIEA.2011.5975723
  • Filename
    5975723