DocumentCode
2635740
Title
Research on the EFT radiation characteristic of classical structures used in Measuring-control System
Author
Liu, Chao ; Wang, Lixin ; Zhao, Dan ; Luo, Weilin
Author_Institution
Sch. of Electr. Eng. & Autom., Harbin Inst. of Technol., Harbin, China
fYear
2011
fDate
21-23 June 2011
Firstpage
948
Lastpage
952
Abstract
This paper analyzed the Electrical Fast Transient (EFT) radiation interference characteristic and effect factors of three classical structures including: the electromagnetic relay, the inductance coil and the thin wire which are commonly used in the Measuring-control System. The EFT interference radiation model has been built by the NUFDTD method. This method divides the simulation space into a sort of grids which are non-uniform. Thus it can acquire a more detailed simulation model while using less computational resource. Use this method, the changing regularity of EFT radiation field, when the different stimulate source being put on the according structure, has been studied. At the same time, the corresponding relationship of the distributing characteristic of the EFT radiation field and the device structure has been discussed. Finally, based on the analysis and discuss conclusion, according to each classical structure, some anti-interference methods have been brought forward.
Keywords
coils; electromagnetic interference; finite difference time-domain analysis; inductance; EFT interference radiation model; EFT radiation field; EFT radiation interference characteristic; NUFDTD method; classical structure; electrical fast transient; electromagnetic relay; inductance coil; measuring-control system; simulation model; thin wire; Coils; Electromagnetics; Inductance; Interference; Magnetic noise; Relays; Wires; EFT; NUFDTD method; radiation characteristic;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications (ICIEA), 2011 6th IEEE Conference on
Conference_Location
Beijing
ISSN
pending
Print_ISBN
978-1-4244-8754-7
Electronic_ISBN
pending
Type
conf
DOI
10.1109/ICIEA.2011.5975723
Filename
5975723
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