• DocumentCode
    2635752
  • Title

    Design and analysis of anchorless shuttle nano-electro-mechanical non-volatile memory for high temperature applications

  • Author

    Vaddi, Ramesh ; Kim, Tony T. ; Pott, Vincent ; Lin, Julius Tsai Ming

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2012
  • fDate
    15-19 April 2012
  • Abstract
    This paper presents a novel nano-electro-mechanical (NEM) non-volatile memory (NVM) based on an anchorless structure for high operating temperature (>;200°C). The proposed NEM NVM device has two stable mechanical states obtained by adhesion forces, and is actuated by electrostatic forces. This work further discusses the modeling of the NEM memory device and the scaling effects on the device performance. Finally, a memory cell consisting of the NEM memory device and two MOS transistors (1NEM-2T), and NEM NVM array structure are presented.
  • Keywords
    MOSFET; adhesion; nanoelectromechanical devices; random-access storage; MOS transistors; adhesion forces; anchorless structure; electrostatic forces; mechanical states; memory cell; nanoelectromechanical nonvolatile memory; scaling effects; Arrays; Electrodes; Electrostatics; Force; Logic gates; Nonvolatile memory; Switches; High temperature applications; Non volatile memories (NVMs); nano-electromechanical devices (NEMs);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2012 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4577-1678-2
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2012.6241917
  • Filename
    6241917