DocumentCode
2635752
Title
Design and analysis of anchorless shuttle nano-electro-mechanical non-volatile memory for high temperature applications
Author
Vaddi, Ramesh ; Kim, Tony T. ; Pott, Vincent ; Lin, Julius Tsai Ming
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2012
fDate
15-19 April 2012
Abstract
This paper presents a novel nano-electro-mechanical (NEM) non-volatile memory (NVM) based on an anchorless structure for high operating temperature (>;200°C). The proposed NEM NVM device has two stable mechanical states obtained by adhesion forces, and is actuated by electrostatic forces. This work further discusses the modeling of the NEM memory device and the scaling effects on the device performance. Finally, a memory cell consisting of the NEM memory device and two MOS transistors (1NEM-2T), and NEM NVM array structure are presented.
Keywords
MOSFET; adhesion; nanoelectromechanical devices; random-access storage; MOS transistors; adhesion forces; anchorless structure; electrostatic forces; mechanical states; memory cell; nanoelectromechanical nonvolatile memory; scaling effects; Arrays; Electrodes; Electrostatics; Force; Logic gates; Nonvolatile memory; Switches; High temperature applications; Non volatile memories (NVMs); nano-electromechanical devices (NEMs);
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4577-1678-2
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2012.6241917
Filename
6241917
Link To Document