DocumentCode :
2635997
Title :
Calibration Method for a CMOS 0.06mm^2 150MS/s 8-bit ADC
Author :
Petrellis, Nikos ; Birbas, Michael ; Kikidis, John ; Birbas, Alexios
Author_Institution :
Analogies S.A., Patras, Greece
fYear :
2009
fDate :
27-29 Aug. 2009
Firstpage :
191
Lastpage :
195
Abstract :
An ultra low area 8-bit Analog-to-Digital Converter (ADC) has been designed achieving a 150 MS/S sampling rate and dissipating 34 mW power. It is based on integer division circuits that are arranged in a binary tree structure. We emphasize on the digital calibration method of such an ADC in order to extend its operational temperature range and correct the effect of mismatch and process variations. The calibration is achieved by controlling the voltage supply of the root divider and the amplification and offset correction of the residue that is produced by this divider.
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; calibration; dividing circuits; trees (mathematics); CMOS technology; amplification; analog-to-digital converter; asynchronous 8-bit ADC; binary tree structure; current mode 8-bit ADC; digital calibration method; integer division circuits; offset correction; power 34 mW; root divider; voltage supply; Analog-digital conversion; Binary trees; CMOS technology; Calibration; Capacitors; Mirrors; Power supplies; Sampling methods; Temperature distribution; Temperature sensors; Analog Digital Conversion; Calibration; Integer Division;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design, Architectures, Methods and Tools, 2009. DSD '09. 12th Euromicro Conference on
Conference_Location :
Patras
Print_ISBN :
978-0-7695-3782-5
Type :
conf
DOI :
10.1109/DSD.2009.182
Filename :
5350102
Link To Document :
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