DocumentCode
2636004
Title
Predicting TEM cell measurements from near field scan data
Author
Weng, Haixiao ; Beetner, Daryl G. ; Dubroff, Richard E.
Author_Institution
University of Missouri-Rolla
Volume
3
fYear
2006
fDate
14-18 Aug. 2006
Firstpage
560
Lastpage
564
Keywords
Electric variables measurement; Electromagnetic measurements; Electromagnetic modeling; IEC standards; Integrated circuit measurements; Magnetic field measurement; Predictive models; Probes; Semiconductor device measurement; TEM cells;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location
Portland, OR, USA
Print_ISBN
1-4244-0293-X
Type
conf
DOI
10.1109/ISEMC.2006.1706371
Filename
1706371
Link To Document