DocumentCode
2636151
Title
Organic Thin Film Transistor degradation under sunlight exposure
Author
Wrachien, N. ; Cester, A. ; Bari, D. ; Meneghesso, G. ; Kovac, J. ; Jakabovic, J. ; Donoval, D.
Author_Institution
Dept. of Inf. Eng., Univ. of Padova, Padova, Italy
fYear
2012
fDate
15-19 April 2012
Abstract
We irradiated Organic Thin-Film Transistors with wavelengths ranging in the visible and near ultraviolet parts of the solar spectrum, reporting strong degradation in few hours. We modeled the sunlight-induced permanent degradation, taking into account the mobility reduction. The model closely fits the experimental data, allowing the prediction of the device permanent degradation under sunlight exposure.
Keywords
semiconductor device reliability; solar radiation; thin film transistors; mobility reduction; organic thin film transistor degradation; solar spectrum; sunlight exposure; sunlight induced permanent degradation; Charge carrier processes; Degradation; Organic thin film transistors; Pentacene; Photonics; Radiation effects; irradiation; organic devices; reliability; thin-film-transistor;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4577-1678-2
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2012.6241936
Filename
6241936
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