• DocumentCode
    2636151
  • Title

    Organic Thin Film Transistor degradation under sunlight exposure

  • Author

    Wrachien, N. ; Cester, A. ; Bari, D. ; Meneghesso, G. ; Kovac, J. ; Jakabovic, J. ; Donoval, D.

  • Author_Institution
    Dept. of Inf. Eng., Univ. of Padova, Padova, Italy
  • fYear
    2012
  • fDate
    15-19 April 2012
  • Abstract
    We irradiated Organic Thin-Film Transistors with wavelengths ranging in the visible and near ultraviolet parts of the solar spectrum, reporting strong degradation in few hours. We modeled the sunlight-induced permanent degradation, taking into account the mobility reduction. The model closely fits the experimental data, allowing the prediction of the device permanent degradation under sunlight exposure.
  • Keywords
    semiconductor device reliability; solar radiation; thin film transistors; mobility reduction; organic thin film transistor degradation; solar spectrum; sunlight exposure; sunlight induced permanent degradation; Charge carrier processes; Degradation; Organic thin film transistors; Pentacene; Photonics; Radiation effects; irradiation; organic devices; reliability; thin-film-transistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2012 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4577-1678-2
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2012.6241936
  • Filename
    6241936