Title :
Large-Signal S-Parameter Characterization of UHF Power Transistors
Author :
Chaffin, R.J. ; Leighton, W.H.
Abstract :
The problems involved in the measurement and application of large-signal S-parameters for UHF power transistors are discussed. Experimental results obtained using a specially designed high-power S-parameter test set are reported.
Keywords :
Area measurement; Circuit testing; Directional couplers; Frequency; Impedance measurement; Power measurement; Power transistors; Scattering parameters; UHF measurements; Voltmeters;
Conference_Titel :
Microwave Symposium, 1973 IEEE G-MTT International
Conference_Location :
Boulder, CO, USA
DOI :
10.1109/GMTT.1973.1123131
