Title :
Query-based coordinated multiple views with Feature Similarity Space for visual analysis of MRI repositories
Author :
Bowman, Ian ; Joshi, Shantanu H. ; Van Horn, John Darrell
Author_Institution :
Lab. of Neuro Imaging, Univ. of California Los Angeles, Los Angeles, CA, USA
Abstract :
It is a laborious process to quantify relationship patterns within a feature-rich archive. For example, understanding the degree of neuroanatomical similarity between the scanned subjects of a Magnetic Resonance Imaging (MRI) repository is a nontrivial task. In this work we present a Coordinated Multiple View (CMV) system for visually analyzing collections of feature-rich datasets. A query-based user interface operates on a feature-respective data scheme, and is geared towards domain experts that are non-specialists in informatics and analytics. We employ multi-dimensional scaling (MDS) to project feature surface representations into three-dimensions, where proximity in location is proportional to the feature similarity. Through query feedback and environment navigation, the user groups clusters that exhibit probable trends across feature and attribute. The system provides supervised classification methods for determining attribute classes within the user selected groups. Finally, using visual or analytical feature-wise exploration the user determines intra-group feature commonality.
Keywords :
biomedical MRI; data visualisation; pattern classification; query processing; user interfaces; CMV system; MRI repository; feature similarity space; feature-rich archive; feature-rich dataset; magnetic resonance imaging; multidimensional scaling; neuroanatomical similarity; query-based coordinated multiple views; query-based user interface; supervised classification method; visual analysis; Feature extraction; Frequency selective surfaces; Image color analysis; Magnetic resonance imaging; Neuroimaging; Visualization; Coordinated multiple views; data mining; query-based visualization;
Conference_Titel :
Visual Analytics Science and Technology (VAST), 2011 IEEE Conference on
Conference_Location :
Providence, RI
Print_ISBN :
978-1-4673-0015-5
DOI :
10.1109/VAST.2011.6102467