Title :
TDR/TDT analysis by crosstalk in single and differential meander delay lines for high speed PCB applications
Author :
Kim, Gawon ; Kam, Dong Gun ; Kim, Joungho
Author_Institution :
KAIST
Keywords :
Coupling circuits; Crosstalk; Delay effects; Delay lines; Differential equations; Integrated circuit measurements; Packaging; Printed circuits; Reflectometry; Time domain analysis;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
DOI :
10.1109/ISEMC.2006.1706392