• DocumentCode
    2636464
  • Title

    Experimental characterization of relationship between s parameters and radiated emission for solid and EBG types of power bus structures

  • Author

    Sudo, Toshio ; Kato, Toshimi ; Ichijo, Seiju

  • Author_Institution
    Toshiba Corporation
  • Volume
    3
  • fYear
    2006
  • fDate
    14-18 Aug. 2006
  • Firstpage
    692
  • Lastpage
    695
  • Keywords
    CMOS logic circuits; Capacitors; Insulation; Metamaterials; Periodic structures; Power supplies; Printed circuits; Routing; Scattering parameters; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    1-4244-0293-X
  • Type

    conf

  • DOI
    10.1109/ISEMC.2006.1706398
  • Filename
    1706398
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2636464