Title :
Voltage control devices on the IEEE 8500 node test feeder
Author :
Schneider, K.P. ; Fuller, J.C.
Author_Institution :
Battelle Seattle Res. Center, Pacific Northwest Nat. Lab., Seattle, WA, USA
Abstract :
The IEEE Test Cases provide researchers with distribution system models that can be used to validate new analytic methods. The newest of these models is the 8500-node test feeder which contains multiple devices for voltage control. In addition to a substation regulator there are multiple inline regulators as well as capacitor banks. This paper will discuss the detail in which voltage control devises should be modeled when examining large distribution systems. This discussion will include issues associated with power flow analysis for a single time step as well as for time series analysis.
Keywords :
Capacitors; Centralized control; Large-scale systems; Load flow analysis; Power system modeling; Regulators; Substations; System testing; Topology; Voltage control; Gauss-Seidel; distribution system analysis; forwardbackward sweep method; power modeling; power simulation; smart grid;
Conference_Titel :
Transmission and Distribution Conference and Exposition, 2010 IEEE PES
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
978-1-4244-6546-0
DOI :
10.1109/TDC.2010.5484225
