Rapid SVBRDF Measurement by Algebraic Solution Based on Adaptive Illumination

In this paper, we propose an algebraic solution for rapid SVBRDF measurement. The algebraic approach requires only a few reflectance samples to obtain the parameters described by the physically based Cook - Torrance model. This solution, however, also involves constraints concerning light and the normal direction in the acquisition process. To meet these constraints, we developed a system that changes the illumination according to the target 3D shape at high speed. As a result, the proposed method provides BRDF parameters at each texel without optimization and over-sampling. We demonstrated rapid measurement with real objects that do not have uniform reflectance and confirmed the validity of this approach by comparison with conventional methods.