Title :
Electric field probing by incorporating Franz-Keldysh electroabsorption effect and optical-beam-induced-current technique
Author :
Cheng, Wen-Chin ; Chiu, Yi-Jen ; Kao, Fu-Jen
Author_Institution :
Inst. of Opt. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Abstract :
In this paper, a simple optical-beam-induced-current (OBIC) method using Franz-Keldysh (FK) effect is proposed to map the electric fields inside InP substrate. Due to electroabsorption effect, the OBIC by excitation at nearly below bandgap can directly and in-situ maps the electric field inside the substrate.
Keywords :
OBIC; electroabsorption; Franz-Keldysh electroabsorption effect; InP substrate; OBIC; bandgap; electric field probing; optical-beam-induced-current technique; Absorption; Coplanar waveguides; Focusing; Indium phosphide; Microscopy; Optical beams; Photoconductivity; Photonic band gap; Probes; Strips;
Conference_Titel :
Lasers and Electro-Optics Society, 2005. LEOS 2005. The 18th Annual Meeting of the IEEE
Print_ISBN :
0-7803-9217-5
DOI :
10.1109/LEOS.2005.1548293
