DocumentCode :
2637600
Title :
The radiation tolerant readout system for srambased neutron detector
Author :
Makowski, D. ; Grecki, M. ; Mukherjee, B. ; Swiercz, B. ; Simrock, S. ; Napieralski, A.
Author_Institution :
Tech. Univ. of Lodz
fYear :
2006
fDate :
22-24 June 2006
Firstpage :
95
Lastpage :
100
Abstract :
Bremsstrahlung gamma radiation and photoneutrons are produced during the operation of high energy linear accelerators. The functionality of electronic devices that are placed inside accelerator tunnels can be jeopardized because of the negative influence of generated radiation. Therefore, a radiation monitoring system able to gauge neutron fluence and gamma dose in real time was constructed. Radiation-sensitive dosimeters cooperate with a readout system. The readout continuously measures both types of radiation and sends quantified data to a main computer. The system is also placed in the tunnel, hence it must be insensitive to radiation or able to tolerate induced malfunctions. A few different readout systems were designed. This work presents the application of different readouts designed using commercial of the shelf (COTS) components. The presented hardware was tested with americium-beryllium neutron source. Finally, the systems were irradiated in a linear accelerator tunnel to estimate their immunity and suitability for a long-term reliable operation in the radioactive field
Keywords :
display instrumentation; dosimeters; neutron detection; nuclear instrumentation; radiation hardening (electronics); radiation monitoring; shielding; Am; Be; Bremsstrahlung gamma radiation; COTS; SRAM-based neutron detector; accelerator tunnels; americium; beryllium; commercial of the shelf; high energy linear accelerators; neutron flux measurement; photoneutrons; radiation tolerance; radiation tolerant system; radiation-sensitive dosimeters; readout system; single event upset; Application software; Electron accelerators; Gamma rays; Hardware; Linear accelerators; Neutrons; Radiation detectors; Radiation monitoring; Real time systems; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. Proceedings of the International Conference
Conference_Location :
Gdynia
Print_ISBN :
83-922632-2-7
Type :
conf
DOI :
10.1109/MIXDES.2006.1706545
Filename :
1706545
Link To Document :
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