• DocumentCode
    2637649
  • Title

    Punsim: an advanced surface potential based MOSFET model

  • Author

    He, J. ; Song, Y. ; Niu, X. ; Li, B. ; Zhang, X. ; Huang, R. ; Chan, M. ; Wang, Y.

  • Author_Institution
    Peking Univ., Beijing
  • fYear
    2006
  • fDate
    22-24 June 2006
  • Firstpage
    111
  • Lastpage
    116
  • Abstract
    This paper reviews present compact model development and outlines the main features of the PUNSIM, an advanced surface potential-based MOSFET model. The PUNSIM is developed to overcome mainly drawbacks of the traditional surface potential based models and aiming at fulfilling the features: The first-principle derivation of the complete MOSFET surface potential equation; Physics based analytic solution of the surface potential equation; accurate description of inversion charge; Physics based channel current equation and calculation; self-consistently modelling of short-channel effects; Unique parameter scaling technology to ensure the high accuracy parameter extraction. PUNSIM model takes the quite analytic formulation without any need for the smooth function and iteration mathematics, thus posses the surface potential based MOS model high accurate and continuous characteristics while obtaining computation efficiency, a must for the ULSI circuit simulation. The model predictions have also been verified by the numerical analysis and the wide experiment data, proving the PUNSIM validity
  • Keywords
    MOSFET; ULSI; semiconductor device models; surface potential; MOSFET model; PUNSIM; ULSI circuit simulation; advanced surface potential; channel current equation; inversion charge; parameter extraction; short-channel effects; Circuit analysis computing; Circuit simulation; Equations; MOSFET circuits; Mathematical model; Mathematics; Parameter extraction; Physics; Predictive models; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. Proceedings of the International Conference
  • Conference_Location
    Gdynia
  • Print_ISBN
    83-922632-2-7
  • Type

    conf

  • DOI
    10.1109/MIXDES.2006.1706549
  • Filename
    1706549