Title :
Fault-tolerance in FPGA focusing power reduction or performance enhancement
Author :
Leong, C. ; Semiao, J. ; Santos, M.B. ; Teixeira, I.C. ; Teixeira, J.P.
Author_Institution :
INESC-ID Lisboa, Lisbon, Portugal
Abstract :
The purpose of this paper is to present a Fault-Tolerance methodology for FPGA-based designs, focusing power reduction or performance enhancement during on-field operation. The methodology is based on a new performance sensor which predictively detects errors in critical paths, either allowing power-supply voltage (VDD) to be reduced, or clock frequency (fclk) to be raised, driving power reduction or performance increase. The HDL sensor´s functionality is defined by the designer, according to the target circuit configuration in the FPGA structure. The adaptive scheme uses an Automatic Voltage and Frequency Controller (AVFC) to modify fclk and/or VDD, while still guaranteeing safe operation. The built-in sensors identify performance deviations in pre-identified critical paths during circuit operation and along product lifetime, caused by parametric variations and/or aging. The fclk increase is made possible by reducing the pessimistic safety-margins defined by standard simulation tools to account for variability. The sensors delay margins are programmable, so an adequate delay margin can guarantee safe operation. Conversely, the same performance can be achieved with lower VDD. Simulation and experimental results with Virtex 5 and Spartan 6 FPGAs show that significant performance improvements (typically, 30%) can be achieved with this methodology.
Keywords :
ageing; automatic frequency control; clocks; delay circuits; error detection; fault tolerance; field programmable gate arrays; sensors; voltage regulators; AVFC; FPGA-based designs; HDL sensor functionality; Spartan 6 FPGA; Virtex 5; aging; automatic voltage and frequency controller; built-in sensors; circuit operation; clock frequency; error detection; fault tolerance methodology; fclk; focusing power reduction; on-field operation; parametric variations; performance sensor enhancement; pessimistic safety-margins; power-supply voltage; preidentified critical paths; product lifetime; sensors delay margins; standard simulation tools; target circuit configuration; Aging; Clocks; Delays; Field programmable gate arrays; Frequency control; Monitoring; Tunneling magnetoresistance; Aging sensor; FPGA circuits; Performance improvement; Performance sensor; Power saving; Voltage and Frequency Controller;
Conference_Titel :
Test Symposium (LATS), 2015 16th Latin-American
Conference_Location :
Puerto Vallarta
DOI :
10.1109/LATW.2015.7102523