Title :
Reducing peak power consumption of combinational test sets
Author :
Macii, Alberto ; Macii, Enrico ; Poncino, Massimo
Author_Institution :
Dipt. di Autom. e Inf., Politecnico di Torino, Italy
Abstract :
Besides fault coverage and application time, another important parameter that must be considered for evaluating the quality of a given set of test vectors (i.e., a test set) is the peak power the circuit dissipates when the vectors are sequentially supplied at the primary input pins. In this paper we address the problem of minimizing the peak power of a given combinational test set. We present an effective, graph-based solution to generate a power-conscious test set that is minimally intrusive with respect to the original one. Besides achieving reduced peak power consumption, our algorithm guarantees the initial fault coverage to be preserved, and the size of the newly generated test set to be kept under strict control. We have applied our technique to test sets generated by a state-of-the-art ATPG tool for all the Iscas´85 combinational benchmark circuits. The results we have obtained are very promising, and indicate the practical applicability of the proposed solution.
Keywords :
CMOS logic circuits; VLSI; automatic test pattern generation; combinational circuits; graph theory; integrated circuit testing; logic testing; power consumption; ATPG tool; CMOS digital circuits design; Iscas´85 combinational benchmark circuits; VLSI circuits; algorithm; application time; combinational test sets; combinatorial circuits; fault coverage; graph-based solution; peak power consumption reduction; peak power dissipation; power-conscious test set; primary input pins; test vectors; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Clocks; Combinational circuits; Digital circuits; Energy consumption; Power generation; Sequential analysis;
Conference_Titel :
Signals, Systems & Computers, 1998. Conference Record of the Thirty-Second Asilomar Conference on
Conference_Location :
Pacific Grove, CA, USA
Print_ISBN :
0-7803-5148-7
DOI :
10.1109/ACSSC.1998.751421