Title :
Notice of Retraction
Look into the mind or look at the eyes: A comparison of Chinese and westerners´ beliefs of lies
Author :
Ning Zhang ; Yuqing Zhang ; Tingyu Zhang ; Kankan Wu
Author_Institution :
Inst. of Psychol., Grad. Univ. of the Chinese Acad. of Sci., Beijing, China
Abstract :
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
Questions have often been raised whether there is a universal stereotype of the liar across cultures, and whether people from different cultures use the same cues to detect deception. Inspired by The Global Deception Research Team s worldwide investigation of stereotypes of liars, the present study explores native Chinese beliefs of liars with demographically diversified samples and compares the results with those of TGDRT. In Study 1, researchers investigated Chinese beliefs of liars by asking participants to complete a questionnaire of lying behavior. In Study 2, participants responded to the open-ended question, “How can you tell when people are lying?” The results suggest that there are both similarities and differences between Chinese and the western beliefs about liars and lying behavior. The causalities of the similarities and discrepancies are provided from social developmental and evolutionary psychological perspectives.
Keywords :
psychology; Chinese beliefs of lies; The Global Deception Research Team; deception detection; evolutionary psychological perspective; westerners beliefs of lies; Accuracy; Cultural differences; Educational institutions; Encoding; Humans; Medical services; Psychology; beliefs; cross-cultural; deception; lying behavior; stereotypes;
Conference_Titel :
Web Society (SWS), 2010 IEEE 2nd Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-6356-5
DOI :
10.1109/SWS.2010.5607394