DocumentCode :
2639014
Title :
In-plane Anisotropy In Thin Film Media Analyzed By Grazing Incidence X-ray Diffraction
Author :
Hirose, T. ; Teranishi, H. ; Ohsawa, M. ; Ishiwata, O. ; Ataka, T. ; Ozawa, K. ; Komiya, S. ; Iida, A.
Author_Institution :
Fuji Electric Corp. R & D Ltd
fYear :
1997
fDate :
1-4 April 1997
Keywords :
Anisotropic magnetoresistance; Coercive force; Magnetic anisotropy; Magnetic field induced strain; Parameter estimation; Substrates; Temperature; Transistors; Voltage; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
Type :
conf
DOI :
10.1109/INTMAG.1997.597590
Filename :
597590
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2639014
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