DocumentCode
2639014
Title
In-plane Anisotropy In Thin Film Media Analyzed By Grazing Incidence X-ray Diffraction
Author
Hirose, T. ; Teranishi, H. ; Ohsawa, M. ; Ishiwata, O. ; Ataka, T. ; Ozawa, K. ; Komiya, S. ; Iida, A.
Author_Institution
Fuji Electric Corp. R & D Ltd
fYear
1997
fDate
1-4 April 1997
Keywords
Anisotropic magnetoresistance; Coercive force; Magnetic anisotropy; Magnetic field induced strain; Parameter estimation; Substrates; Temperature; Transistors; Voltage; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location
New Orleans, LA, USA
Print_ISBN
0-7803-3862-6
Type
conf
DOI
10.1109/INTMAG.1997.597590
Filename
597590
Link To Document