DocumentCode
2639104
Title
Interconnection Capacitances Dependence On Further Neighbourhood In The Bus - Experimental Verification Of The Model
Author
Jarosz, A. ; Pfitzner, A.
Author_Institution
Inst. of Electron Technol.
fYear
2006
fDate
22-24 June 2006
Firstpage
480
Lastpage
485
Abstract
An analytical model, taking into account the further neighbourhood influence on interconnection capacitances was proposed in our previous works (Jarosz, 2002). In this paper a method of experimental verification of those formulas and a test chip designed for the AMS 0.35mum technology are presented. Results of measurements and the correctness of the model are discussed
Keywords
capacitance measurement; integrated circuit interconnections; integrated circuit modelling; 0.35 micron; AMS technology; integrated circuit interconnection; integrated circuit model; interconnection capacitances; Analytical models; Capacitance measurement; Circuit simulation; Computational modeling; Electrons; Integrated circuit interconnections; Parasitic capacitance; Semiconductor device measurement; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. Proceedings of the International Conference
Conference_Location
Gdynia
Print_ISBN
83-922632-2-7
Type
conf
DOI
10.1109/MIXDES.2006.1706626
Filename
1706626
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