Title :
Improving the reliability of power distribution systems through single-phase tripping
Author :
Agüero, Julio Romero ; Wang, Jia ; Burke, James J.
Author_Institution :
Quanta Technol., Raleigh, NC, USA
Abstract :
this paper discusses the reliability benefits (reduction in SAIFI and SAIDI) that could be achieved through the implementation of single-phase tripping in four-wire multigrounded medium-voltage distribution feeders. Several issues and concerns regarding the potential problems caused by single-phase tripping are discussed, and the potential reliability benefits due to the implementation of this protection scheme for a real distribution system of the USA are presented and discussed. These benefits were estimated by running multiple simulations using a predictive reliability model.
Keywords :
Control systems; Costs; Fault currents; Fuses; Power distribution; Power system modeling; Power system protection; Power system reliability; Predictive models; Substations; power distribution reliability; reliability estimation; reliability modeling;
Conference_Titel :
Transmission and Distribution Conference and Exposition, 2010 IEEE PES
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
978-1-4244-6546-0
DOI :
10.1109/TDC.2010.5484372