DocumentCode
2639340
Title
Solder joints properties assessment in the terms of 4P Soldering Model
Author
Plotog, Ioan ; Cucu, Traian ; Mihailescu, Bogdan ; Svasta, Paul ; Branzei, Mihai ; Tarcolea, Mihai ; Miculescu, Florin ; Thumm, Andreas ; Flechtmann, Andreas
Author_Institution
CETTI, UPB, Bucharest, Romania
fYear
2011
fDate
20-23 Oct. 2011
Firstpage
163
Lastpage
168
Abstract
The challenges for the companies involved in conception, development and/or manufacturing of electronic products are the lead-free technology with its increased melting temperature of the solder alloy and trend to reduce the solder materials cost by usage of lead-free solder pastes with low silver content. Defining the elements Pad-Paste-Pin-Process as Key Process Input Variables (KPIV) in terms of 4P Soldering Model concept [1, 3], the solder joints are result of KPIV synergistically interactions and correlations, with consequences over their microstructure. In the paper, taking into consideration the cooling rate influence over intermetallic compounds formation and microstructure, are presented the investigations over electrical, and mechanical properties of solder joints resulted from Vapour Phase Soldering (VPS) process in terms of 4P Soldering Model. Maintaining PAD and PIN of KPIV as references were study the solder joints properties determined by PASTEs as function of cooling rate parameters of VPS PROCESS. The results of the studies performed and presented in the paper will be used for improving process control in order to minimize losses on VPS lines, to reduce defects numbers and rework time in order to achieve “zero defects production”.
Keywords
melting; printed circuit manufacture; reflow soldering; 4P soldering model; cooling rate; defects numbers; intermetallic compounds formation; key process input variables; lead-free technology; melting temperature; pad-paste-pin-process; rework time; solder alloy; solder joints; solder materials cost; solder pastes; vapour phase soldering; zero defects production; Correlation; Force; Geometry; Materials; Metals; Resistors; Soldering; Vapour Phase Soldering; cooling rate;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Technology in Electronic Packaging (SIITME), 2011 IEEE 17th International Symposium for
Conference_Location
Timisoara
Print_ISBN
978-1-4577-1276-0
Electronic_ISBN
978-1-4577-1275-3
Type
conf
DOI
10.1109/SIITME.2011.6102710
Filename
6102710
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