DocumentCode :
2639340
Title :
Solder joints properties assessment in the terms of 4P Soldering Model
Author :
Plotog, Ioan ; Cucu, Traian ; Mihailescu, Bogdan ; Svasta, Paul ; Branzei, Mihai ; Tarcolea, Mihai ; Miculescu, Florin ; Thumm, Andreas ; Flechtmann, Andreas
Author_Institution :
CETTI, UPB, Bucharest, Romania
fYear :
2011
fDate :
20-23 Oct. 2011
Firstpage :
163
Lastpage :
168
Abstract :
The challenges for the companies involved in conception, development and/or manufacturing of electronic products are the lead-free technology with its increased melting temperature of the solder alloy and trend to reduce the solder materials cost by usage of lead-free solder pastes with low silver content. Defining the elements Pad-Paste-Pin-Process as Key Process Input Variables (KPIV) in terms of 4P Soldering Model concept [1, 3], the solder joints are result of KPIV synergistically interactions and correlations, with consequences over their microstructure. In the paper, taking into consideration the cooling rate influence over intermetallic compounds formation and microstructure, are presented the investigations over electrical, and mechanical properties of solder joints resulted from Vapour Phase Soldering (VPS) process in terms of 4P Soldering Model. Maintaining PAD and PIN of KPIV as references were study the solder joints properties determined by PASTEs as function of cooling rate parameters of VPS PROCESS. The results of the studies performed and presented in the paper will be used for improving process control in order to minimize losses on VPS lines, to reduce defects numbers and rework time in order to achieve “zero defects production”.
Keywords :
melting; printed circuit manufacture; reflow soldering; 4P soldering model; cooling rate; defects numbers; intermetallic compounds formation; key process input variables; lead-free technology; melting temperature; pad-paste-pin-process; rework time; solder alloy; solder joints; solder materials cost; solder pastes; vapour phase soldering; zero defects production; Correlation; Force; Geometry; Materials; Metals; Resistors; Soldering; Vapour Phase Soldering; cooling rate;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Technology in Electronic Packaging (SIITME), 2011 IEEE 17th International Symposium for
Conference_Location :
Timisoara
Print_ISBN :
978-1-4577-1276-0
Electronic_ISBN :
978-1-4577-1275-3
Type :
conf
DOI :
10.1109/SIITME.2011.6102710
Filename :
6102710
Link To Document :
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