Testing and reliability

fYear

2006

fDate

22-24 June 2006

Firstpage

561

Lastpage

562

Abstract

Start of the above-titled section of the conference proceedings record.

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. Proceedings of the International Conference

Conference_Location

Gdynia

Print_ISBN

83-922632-2-7

Type

conf

DOI

10.1109/MIXDES.2006.1706642

Filename

1706642

Link To Document