Title :
Innovations in measurement and calibration systems for depot readiness
Author :
McQuiston, Barbara K.
Author_Institution :
SYTRONICS, Inc., Dayton, OH, USA
Abstract :
This paper describes the current contributions of the automated, PC-based electrical measurement and microwave measurement systems to the precision measurement equipment laboratories (PMELs). Applications of this technology to overall depot readiness and performance are also discussed
Keywords :
calibration; computerised instrumentation; graphical user interfaces; microcomputer applications; microwave measurement; EMCC training; PC-based electrical measurement; calibration; depot readiness; measurement; microwave measurement; performance; precision measurement equipment laboratories; Automatic control; Calibration; Control systems; Current measurement; Electric variables measurement; Instruments; Laboratories; Microwave devices; Microwave measurements; Technological innovation;
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
DOI :
10.1109/AUTEST.1993.396290
