DocumentCode :
2639588
Title :
Transmission Line Pulsing Tester For On-chip ESD Protection Testing
Author :
Piatek, Z. ; Pleskacz, W.A. ; Kolodziejski, J.F.
Author_Institution :
Warsaw Univ. of Technol.
fYear :
2006
fDate :
22-24 June 2006
Firstpage :
595
Lastpage :
599
Abstract :
In the paper transmission line pulsing (TLP) methodology and testers are described. In contrast to commonly available publications, which usually lack information on testers´ design, the authors describe TLP tester´s construction details. This includes an applied electric diagram. Conclusions based on up-to-date research and preliminary test results obtained with the help of the assembled TLP tester are provided
Keywords :
electrostatic discharge; integrated circuit testing; system-on-chip; test equipment; transmission lines; ESD protection testing; on-chip; transmission line pulsing tester; Biological system modeling; Circuit testing; Electrostatic discharge; Integrated circuit testing; Power transmission lines; Protection; Pulse measurements; Pulsed power supplies; Transmission lines; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. Proceedings of the International Conference
Conference_Location :
Gdynia
Print_ISBN :
83-922632-2-7
Type :
conf
DOI :
10.1109/MIXDES.2006.1706650
Filename :
1706650
Link To Document :
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