• DocumentCode
    2639601
  • Title

    Integrated Approach to Microwave Design

  • Author

    Bandler, J.W. ; Liu, P.C. ; Tromp, H.

  • Author_Institution
    Dept. of Electr. Eng., McMaster Univ., Hamilton, ON, Canada
  • fYear
    1975
  • fDate
    12-14 May 1975
  • Firstpage
    204
  • Lastpage
    206
  • Abstract
    A new concept of practical design applicable to microwave circuits and involving, in general, simultaneous centering, tolerancing and tuning is presented. The worst-case tolerance problem falls out as a special case. With such an integrated approach, designs previously regarded as unrealistic might be made more attractive. Practical implementation involving, for example, nonideal components and uncertain reference planes is also treated in this paper from the tolerance point of view.
  • Keywords
    fault tolerance; microwave integrated circuits; integrated approach; microwave circuits; microwave design; nonideal components; uncertain reference planes; worst-case tolerance problem; Circuit optimization; Circuit simulation; Computational complexity; Cost function; Design automation; Design optimization; Linear matrix inequalities; Microwave circuits; Process design; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 1975 IEEE-MTT-S International
  • Conference_Location
    Palo Alton, CA
  • Type

    conf

  • DOI
    10.1109/MWSYM.1975.1123334
  • Filename
    1123334