DocumentCode
2639601
Title
Integrated Approach to Microwave Design
Author
Bandler, J.W. ; Liu, P.C. ; Tromp, H.
Author_Institution
Dept. of Electr. Eng., McMaster Univ., Hamilton, ON, Canada
fYear
1975
fDate
12-14 May 1975
Firstpage
204
Lastpage
206
Abstract
A new concept of practical design applicable to microwave circuits and involving, in general, simultaneous centering, tolerancing and tuning is presented. The worst-case tolerance problem falls out as a special case. With such an integrated approach, designs previously regarded as unrealistic might be made more attractive. Practical implementation involving, for example, nonideal components and uncertain reference planes is also treated in this paper from the tolerance point of view.
Keywords
fault tolerance; microwave integrated circuits; integrated approach; microwave circuits; microwave design; nonideal components; uncertain reference planes; worst-case tolerance problem; Circuit optimization; Circuit simulation; Computational complexity; Cost function; Design automation; Design optimization; Linear matrix inequalities; Microwave circuits; Process design; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium, 1975 IEEE-MTT-S International
Conference_Location
Palo Alton, CA
Type
conf
DOI
10.1109/MWSYM.1975.1123334
Filename
1123334
Link To Document