• DocumentCode
    2639745
  • Title

    Third-order optical nonlinearity at excitonic resonance in poly(3-[2-((S)-2-methylbutoxy)ethyl]thiophene)

  • Author

    Kishino, S. ; Ueno, Y. ; Kunugita, H. ; Ema, K. ; Rikukawa, M. ; Ochiai, K. ; Tabuchi, Y. ; Sato, H. ; Sanui, K. ; Ogata, N.

  • Author_Institution
    Dept. of Phys., Sophia Univ., Tokyo, Japan
  • fYear
    1998
  • fDate
    10-14 Aug 1998
  • Firstpage
    233
  • Lastpage
    235
  • Abstract
    The optical properties of polythiophene have generated widespread interest. Because this material shows high electronic conductivity by doping and demonstrate large third-order optical nonlinearity |χ(3)|, it may be applicable as an active material in electro-optical devices. Recently, we reported the enhancement of third-order optical nonlinearity in poly(3-hexylthiophene) (P3HT) by the control of regularity in the polymeric structure. The enhancement is due to increasing the conjugation length. In the present study, we use the thin films of poly(3-[2-(S)-2-methylbutoxy)ethyl]thiophene which is expected to have large conjugation length. We measured |χ(3) |I at excitonic resonance using degenerate four-wave mixing, and estimate the conjugation length of samples
  • Keywords
    excitons; multiwave mixing; nonlinear optical susceptibility; optical films; optical polymers; polymer films; polymer structure; visible spectra; active material; conjugation length; degenerate four-wave mixing; doping; electro-optical devices; excitonic resonance; high electronic conductivity; optical properties; poly(3-[2-((S)-2-methylbutoxy)ethyl]thiophene; poly(3-[2-(S)-2-methylbutoxy)ethyl]thiophene); poly(3-hexylthiophene); polymeric structure; polythiophene; regularity control; samples; thin films; third-order optical nonlinearity; Conducting materials; Conductivity; Doping; Nonlinear optics; Optical devices; Optical films; Optical materials; Optical mixing; Optical polymers; Resonance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nonlinear Optics '98: Materials, Fundamentals and Applications Topical Meeting
  • Conference_Location
    Kauai, HI
  • Print_ISBN
    0-7803-4950-4
  • Type

    conf

  • DOI
    10.1109/NLO.1998.710268
  • Filename
    710268