• DocumentCode
    2639775
  • Title

    B-2 automatic test equipment

  • Author

    Carleton, David L.

  • Author_Institution
    Northrop Aircraft Corp., Pico Rivera, CA, USA
  • fYear
    1993
  • fDate
    20-23 Sep 1993
  • Firstpage
    551
  • Lastpage
    557
  • Abstract
    This paper describes the development of automatic test equipment (ATE) to demonstrate an intermediate level maintenance capability for selected avionics for the B-2 Advanced Technology Bomber (ATB). This paper presents the contractual requirements for B-2 ATE. The ATE development concept and approach presented in detail. The building block approach is described. The history of B-2 automatic test station (ATS) and test program set (TPS) development is described in detail. Specifically, the paper discusses the design team approach to design maintainability into the avionics, the application of ATE concepts originally planned for the F-20 Tigershark, the application of the USAF Modular Automatic Test Equipment (MATE) requirements for both hardware and software, the use of B-2 ATE for factory acceptance of selected avionics, the participation of the TPS industry in grouping of TPS´s into common lots for development, and the creation of a Central TPS Integration Facility (CTIF) to reduce costs. The current status of the B-2 ATE program is described, along with future activities both on contract and planned. Several significant lessons learned (both technical and programmatic) since initiating the B-2 ATE program which have lowered technical risk and reduced program costs are discussed
  • Keywords
    aircraft maintenance; automatic test equipment; automatic test software; avionics; production testing; ATE; B-2 Advanced Technology Bomber; B-2 automatic test equipment; Central TPS Integration Facility; F-20 Tigershark; MATE; USAF Modular Automatic Test Equipment; avionics; costs; design maintainability; factory acceptance; intermediate level maintenance capability; program costs; Aerospace electronics; Application software; Automatic test equipment; Automatic testing; Computer industry; Costs; Hardware; History; Production facilities; Software maintenance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    0-7803-0646-5
  • Type

    conf

  • DOI
    10.1109/AUTEST.1993.396308
  • Filename
    396308