• DocumentCode
    2640007
  • Title

    Integrating logic simulation and dependency modeling

  • Author

    Debany, W.H. ; Daskiewich, Daniel E. ; Unkle, C. Richard

  • Author_Institution
    Rome Lab., Griffis AFB, NY, USA
  • fYear
    1993
  • fDate
    20-23 Sep 1993
  • Firstpage
    467
  • Lastpage
    474
  • Abstract
    Simulatable logic models are used for design and test generation. Dependency models are developed independently to analyze inherent testability characteristics and generate test strategies for diagnosis. This paper describes a set of translation tools that convert logic models into dependency models. These tools reduce both the manual effort required and the chances of undetected errors, as well as streamline configuration management
  • Keywords
    CAD/CAM; automatic testing; design for testability; fault diagnosis; logic CAD; CAD/CAE; dependency modeling; dependency models; logic models; logic simulation; test strategies; testability characteristics; Circuit faults; Circuit simulation; Circuit testing; Computer aided engineering; Design automation; Hardware; Integrated circuit modeling; Logic design; Logic testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    0-7803-0646-5
  • Type

    conf

  • DOI
    10.1109/AUTEST.1993.396319
  • Filename
    396319