DocumentCode
2640007
Title
Integrating logic simulation and dependency modeling
Author
Debany, W.H. ; Daskiewich, Daniel E. ; Unkle, C. Richard
Author_Institution
Rome Lab., Griffis AFB, NY, USA
fYear
1993
fDate
20-23 Sep 1993
Firstpage
467
Lastpage
474
Abstract
Simulatable logic models are used for design and test generation. Dependency models are developed independently to analyze inherent testability characteristics and generate test strategies for diagnosis. This paper describes a set of translation tools that convert logic models into dependency models. These tools reduce both the manual effort required and the chances of undetected errors, as well as streamline configuration management
Keywords
CAD/CAM; automatic testing; design for testability; fault diagnosis; logic CAD; CAD/CAE; dependency modeling; dependency models; logic models; logic simulation; test strategies; testability characteristics; Circuit faults; Circuit simulation; Circuit testing; Computer aided engineering; Design automation; Hardware; Integrated circuit modeling; Logic design; Logic testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location
San Antonio, TX
Print_ISBN
0-7803-0646-5
Type
conf
DOI
10.1109/AUTEST.1993.396319
Filename
396319
Link To Document