Title :
Measuring thickness based on the grayscale value of C-mode SAM images
Author :
Harkai, Endre ; Gordon, Péter
Author_Institution :
Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Budapest, Hungary
Abstract :
Scanning acoustic microscopy is an analysis tool capable for revealing the inner structure of the samples and detecting inhomogeneities inside them, for material characterization and for measuring the thickness of a given layer. A standard method for thickness measurements is based on observing a so called A-mode echo signal. In this paper the authors present pilot results of a method for thickness measurements based on analyzing the grayscale value of the C-mode image. The method can be used only under certain circumstances, but has the advantage to estimate the thickness of a layer using only the C-mode image.
Keywords :
acoustic microscopy; inspection; thickness measurement; A-mode echo signal; C-mode SAM images; grayscale value; material characterization; nondestructive inspection method; scanning acoustic microscopy; thickness measurement; Acoustics; Aluminum; Gray-scale; Materials; Microscopy; Thickness measurement; Ultrasonic variables measurement; Scanning Acoustic Microscopy; grayscale image processing; measuring thickness;
Conference_Titel :
Design and Technology in Electronic Packaging (SIITME), 2011 IEEE 17th International Symposium for
Conference_Location :
Timisoara
Print_ISBN :
978-1-4577-1276-0
Electronic_ISBN :
978-1-4577-1275-3
DOI :
10.1109/SIITME.2011.6102744