DocumentCode
2640082
Title
The product test information model
Author
Russell, Wiliam E., Jr. ; Weiss, Daniel H.
Author_Institution
Wright Lab., Wright Patterson AFB, OH, USA
fYear
1993
fDate
20-23 Sep 1993
Firstpage
437
Lastpage
439
Abstract
This paper discusses the need for a product test information model (PGTIM) and the related tools/methodologies that will bridge the gap between the design and the test program development phases fo the product creation process. The paper explains the approach that PTIM plans to use, based on the EXPRESS-G form of notation, that should allow for PTIM´s broad use and also facilitate its affiliation with the Product Information Layer of the ABBET (A Broad Based Environment for Test) Architecture as well as the other ABBET layers. In addition, the planned use of EXPRESS-G, which should allow PTIM an opportunity to benefit from other programs such as PAP-E and standards activities such as EDIF that also depict information relative to their processes using EXPRESS-G, are reviewed
Keywords
automatic test software; design for testability; production testing; programming environments; EDIF; EXPRESS-G; EXPRESS-G form; PAP-E; product creation process; product test information model; Bridge circuits; Circuit testing; Cost function; Integrated circuit testing; Logic testing; Manufacturing processes; Printed circuits; Process design; Standards activities; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location
San Antonio, TX
Print_ISBN
0-7803-0646-5
Type
conf
DOI
10.1109/AUTEST.1993.396323
Filename
396323
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