• DocumentCode
    2640082
  • Title

    The product test information model

  • Author

    Russell, Wiliam E., Jr. ; Weiss, Daniel H.

  • Author_Institution
    Wright Lab., Wright Patterson AFB, OH, USA
  • fYear
    1993
  • fDate
    20-23 Sep 1993
  • Firstpage
    437
  • Lastpage
    439
  • Abstract
    This paper discusses the need for a product test information model (PGTIM) and the related tools/methodologies that will bridge the gap between the design and the test program development phases fo the product creation process. The paper explains the approach that PTIM plans to use, based on the EXPRESS-G form of notation, that should allow for PTIM´s broad use and also facilitate its affiliation with the Product Information Layer of the ABBET (A Broad Based Environment for Test) Architecture as well as the other ABBET layers. In addition, the planned use of EXPRESS-G, which should allow PTIM an opportunity to benefit from other programs such as PAP-E and standards activities such as EDIF that also depict information relative to their processes using EXPRESS-G, are reviewed
  • Keywords
    automatic test software; design for testability; production testing; programming environments; EDIF; EXPRESS-G; EXPRESS-G form; PAP-E; product creation process; product test information model; Bridge circuits; Circuit testing; Cost function; Integrated circuit testing; Logic testing; Manufacturing processes; Printed circuits; Process design; Standards activities; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    0-7803-0646-5
  • Type

    conf

  • DOI
    10.1109/AUTEST.1993.396323
  • Filename
    396323