DocumentCode :
2640477
Title :
Integrated technology enhanced automatic test equipment with adaptive fault detection
Author :
Kirkland, Larry V. ; Ayala, Jesse ; Bolton, Steve ; Allred, Lloyd G. ; Dean, Jeffrey S.
fYear :
1993
fDate :
20-23 Sep 1993
Firstpage :
267
Lastpage :
272
Abstract :
The authors have developed a machine-based intelligence system for automatic test equipment, which integrates various technologies in an adaptive fault-detection environment. Various technologies, other than normal ATE stimulus - reaction, including infrared, RF detection, etc. perceive non-visible information of current flow and circuit activity which can significantly enhance the technician´s perception of defective components
Keywords :
Automatic test equipment; Circuit testing; Fault detection; Infrared detectors; Intelligent sensors; Machine intelligence; Ontologies; Radio frequency; Sensor systems; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
Type :
conf
DOI :
10.1109/AUTEST.1993.396344
Filename :
396344
Link To Document :
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