DocumentCode
2640515
Title
Time stress measurement device use for on-board diagnostic support
Author
Broadwater, Stuart P. ; Cockey, Edward A.
Author_Institution
Westinghouse Electric Corp., Baltimore, MD, USA
fYear
1993
fDate
20-23 Sep 1993
Firstpage
251
Lastpage
258
Abstract
Time stress measurement systems have been developed to support fielded and emerging systems. This electronic link between the system and maintainer is non-instrusive to the prime mission equipment and provides information as to the cause of failure events in flight. This paper provides a brief background into several programs where TSMD system integration is in progress in mature systems such as the B-1B radar, emerging research and development efforts such as iBITSM, and new platforms. The Time Stress Measurement Device serves on-equipment to capture, pre-process, store, and communicate fault or intermittent data to support flight-line or depot diagnostic tools. Off-equipment elements of the time stress measurement system include data collection, data management, and trend analysis. Time stress measurement has evolved over the last ten years from environmental stress data gathering to advanced Built-In-test-Equipment which supports fault isolation on-equipment and Re-TOK reduction off-equipment
Keywords
airborne radar; automatic test equipment; data acquisition; fault diagnosis; maintenance engineering; microcomputer applications; military avionics; B-1B radar; Built-In-test-Equipment; DoD; Re-TOK reduction off-equipment; data collection; data management; depot diagnostic tools; emerging research; emerging systems; environmental stress data gathering; failure; fault isolation; flight; iBITSM; on-board diagnostic support; prime mission equipment; time stress measurement; trend analysis; Aerospace electronics; Aircraft; Electrical fault detection; Force measurement; Laboratories; Microprocessors; Radar; Stress measurement; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location
San Antonio, TX
Print_ISBN
0-7803-0646-5
Type
conf
DOI
10.1109/AUTEST.1993.396346
Filename
396346
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