• DocumentCode
    2640515
  • Title

    Time stress measurement device use for on-board diagnostic support

  • Author

    Broadwater, Stuart P. ; Cockey, Edward A.

  • Author_Institution
    Westinghouse Electric Corp., Baltimore, MD, USA
  • fYear
    1993
  • fDate
    20-23 Sep 1993
  • Firstpage
    251
  • Lastpage
    258
  • Abstract
    Time stress measurement systems have been developed to support fielded and emerging systems. This electronic link between the system and maintainer is non-instrusive to the prime mission equipment and provides information as to the cause of failure events in flight. This paper provides a brief background into several programs where TSMD system integration is in progress in mature systems such as the B-1B radar, emerging research and development efforts such as iBITSM, and new platforms. The Time Stress Measurement Device serves on-equipment to capture, pre-process, store, and communicate fault or intermittent data to support flight-line or depot diagnostic tools. Off-equipment elements of the time stress measurement system include data collection, data management, and trend analysis. Time stress measurement has evolved over the last ten years from environmental stress data gathering to advanced Built-In-test-Equipment which supports fault isolation on-equipment and Re-TOK reduction off-equipment
  • Keywords
    airborne radar; automatic test equipment; data acquisition; fault diagnosis; maintenance engineering; microcomputer applications; military avionics; B-1B radar; Built-In-test-Equipment; DoD; Re-TOK reduction off-equipment; data collection; data management; depot diagnostic tools; emerging research; emerging systems; environmental stress data gathering; failure; fault isolation; flight; iBITSM; on-board diagnostic support; prime mission equipment; time stress measurement; trend analysis; Aerospace electronics; Aircraft; Electrical fault detection; Force measurement; Laboratories; Microprocessors; Radar; Stress measurement; System testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    0-7803-0646-5
  • Type

    conf

  • DOI
    10.1109/AUTEST.1993.396346
  • Filename
    396346