• DocumentCode
    264071
  • Title

    Design of folded CCDs for ultra high speed imaging

  • Author

    Nguyen, Hieu D. ; Dao, V.T.S. ; Etoh, Takeharu G.

  • Author_Institution
    Sch. of Electron. & Telecommun., Ha Noi Univ. of Sci. & Technol., Hanoi, Vietnam
  • fYear
    2014
  • fDate
    July 30 2014-Aug. 1 2014
  • Firstpage
    327
  • Lastpage
    330
  • Abstract
    The simplest idea to design an in-situ memory CCD is to fold it and install in each pixel. The conventional CCD process technology with double or triple poly-silicon electrodes makes it very difficult to achieve folded CCDs. By utilizing a conventional CMOS process technology with only a single poly-silicon layer consisting of plurality of electrodes with a spacing of 150nm, we can design folded CCDs installed in each pixel. However, it is challenging to realize a practical folded CCD that has sufficient transfer efficiency and reasonable amount of full well capacity. This paper reports a design of folded CCDs for ultra high speed imaging with example simulation results.
  • Keywords
    CCD image sensors; CMOS image sensors; electrochemical electrodes; elemental semiconductors; silicon; CCD process technology; CMOS process technology; Si; distance 150 nm; double polysilicon electrode layer; triple polysilicon electrode layer; ultrahigh speed CCD imaging; Charge coupled devices; BSI; CCD; ISAS; ISIS; high-speed; image sensor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications and Electronics (ICCE), 2014 IEEE Fifth International Conference on
  • Conference_Location
    Danang
  • Print_ISBN
    978-1-4799-5049-2
  • Type

    conf

  • DOI
    10.1109/CCE.2014.6916724
  • Filename
    6916724