Title :
TPS life cycle improvements using artificial intelligence
Author :
Walsh, John G. ; Handwerk, Dwayne D.
Author_Institution :
IBM Corp., Owego, NY, USA
Abstract :
Test Program Sets (TPS) are a significant investment in today´s complex electronics. Military and commercial services alike are currently exploring new approaches to TPSs. Artificial Intelligence (AI) techniques can provide significant cost and performance benefits. This paper identifies the TPS tasks across the entire life cycle, the AI techniques applicable to those tasks, and the resulting obtainable benefits
Keywords :
artificial intelligence; automatic test software; electronic equipment testing; knowledge based systems; military equipment; TPS; TPS life cycle improvements; artificial intelligence; commercial services; complex electronics; cost; goal directed reasoning; military services; performance; rule based reasoning; test program set; Artificial intelligence; Automatic testing; Automation; Cost function; Electronic equipment testing; Humans; Investments; Logistics; System testing; Voltage;
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
DOI :
10.1109/AUTEST.1993.396360
