DocumentCode
2640736
Title
TPS life cycle improvements using artificial intelligence
Author
Walsh, John G. ; Handwerk, Dwayne D.
Author_Institution
IBM Corp., Owego, NY, USA
fYear
1993
fDate
20-23 Sep 1993
Firstpage
113
Lastpage
121
Abstract
Test Program Sets (TPS) are a significant investment in today´s complex electronics. Military and commercial services alike are currently exploring new approaches to TPSs. Artificial Intelligence (AI) techniques can provide significant cost and performance benefits. This paper identifies the TPS tasks across the entire life cycle, the AI techniques applicable to those tasks, and the resulting obtainable benefits
Keywords
artificial intelligence; automatic test software; electronic equipment testing; knowledge based systems; military equipment; TPS; TPS life cycle improvements; artificial intelligence; commercial services; complex electronics; cost; goal directed reasoning; military services; performance; rule based reasoning; test program set; Artificial intelligence; Automatic testing; Automation; Cost function; Electronic equipment testing; Humans; Investments; Logistics; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location
San Antonio, TX
Print_ISBN
0-7803-0646-5
Type
conf
DOI
10.1109/AUTEST.1993.396360
Filename
396360
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