DocumentCode
2640806
Title
Mission relevant testing
Author
Lopez, Marc ; Horman, Mel ; Luu, Thanh ; Orlando, Harold
Author_Institution
Northrop Corp., Hawthorne, CA, USA
fYear
1993
fDate
20-23 Sep 1993
Firstpage
97
Lastpage
100
Abstract
A methodology for determining test criteria based on specific mission requirements has been developed which allows greater flexibility in setting pass/fail criteria for automated testing. The rationale for the introduction of mission relevant testing is given along with an illustrative example of its use. The example shows how mission relevant testing can be useful in providing pass/fail criteria which maximizes the utility of sensor systems in specific missions
Keywords
automatic testing; electronic equipment testing; infrared detectors; infrared imaging; military systems; FLIR sensor testing; automated testing; minimum resolvable temperature; mission relevant testing; pass/fail criteria; sensor systems; specific mission requirements; test criteria; Aerospace electronics; Automatic testing; Electronic equipment testing; Infrared detectors; Personnel; Production facilities; Signal processing algorithms; System testing; Target recognition; Weapons;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location
San Antonio, TX
Print_ISBN
0-7803-0646-5
Type
conf
DOI
10.1109/AUTEST.1993.396363
Filename
396363
Link To Document