Title :
Competitive mixture of deformable models for pattern classification
Author :
Cheung, Kwok-Wai ; Dit-Yan Yeung ; Chin, Roland T.
Author_Institution :
Dept. of Comput. Sci., Hong Kong Univ. of Sci. & Technol., Clear Water Bay, Hong Kong
Abstract :
Following the success of applying deformable models to feature extraction, a natural next step is to apply such models to pattern classification. Recently, we have cast a deformable model under a Bayesian framework for classification, giving promising results. However, deformable model methods are computationally expensive due to the required iterative optimization process. The problem is even more severe when there are a large number of models (e.g., for character recognition), because each of them has to deform and match with the input data before a final classification can be derived. In this paper, we propose to combine the deformable models into a mixture, in which the individual models compete with each other to survive the matching process during classification. Models that do not compete well are eliminated early, thus allowing substantial savings in computation. This process of competition-elimination has been applied to handwritten digit recognition in which significant speedup can be achieved without sacrificing recognition accuracy
Keywords :
character recognition; competitive algorithms; image classification; Bayesian framework; character recognition; deformable models; handwritten digit recognition; iterative optimization; pattern classification; Bayesian methods; Context modeling; Deformable models; Delta modulation; Feature extraction; Handwriting recognition; Image recognition; Iterative methods; Pattern classification; Pattern recognition;
Conference_Titel :
Computer Vision and Pattern Recognition, 1996. Proceedings CVPR '96, 1996 IEEE Computer Society Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-7259-5
DOI :
10.1109/CVPR.1996.517136