DocumentCode
2640926
Title
Design and implementation of the multilevel test philosophy
Author
Hardenburg, Gary ; Duong, Thao
Author_Institution
GDE Systems, Inc., San Diego, CA, USA
fYear
1993
fDate
20-23 Sep 1993
Firstpage
41
Lastpage
45
Abstract
This paper describes the design and implementation of a Test Program Set (TPS) based on a multilevel test philosophy. The multilevel test philosophy not only incorporates the concepts of vertical testability and directed diagnostics, but also explores the test strategy and test encapsulation concepts being defined by the IEEE A Broad Based Environment for Test (ABBET) subcommittee
Keywords
automatic test software; electronic equipment testing; fault diagnosis; fault location; military computing; societies; Air Force; IEEE A Broad Based Environment for Test; Test Program Set; directed diagnostics; multilevel test philosophy; test encapsulation; test strategy; vertical testability; Databases; Displays; Encapsulation; Fault detection; Packaging; Performance evaluation; Prototypes; Software prototyping; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location
San Antonio, TX
Print_ISBN
0-7803-0646-5
Type
conf
DOI
10.1109/AUTEST.1993.396370
Filename
396370
Link To Document